Automatic device for testing thermal resistance with thermoelectric effect

I. M. Vasiliev, A. I. Soldatov, A. A. Dementiev, A. A. Soldatov, A. Abouellaill

Division for Electronic Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.

Original language	English
Article number	012047
Journal	Journal of Physics: Conference Series
Volume	1499
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/1499/1/012047
Publication status	Published - 11 Jun 2020
Event	8th International Conference on Actual Trends in Radiophysics - Tomsk, Russian Federation Duration: 1 Oct 2019 → 4 Oct 2019

ASJC Scopus subject areas

Physics and Astronomy(all)

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title = "Automatic device for testing thermal resistance with thermoelectric effect",

abstract = "This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.",

author = "Vasiliev, {I. M.} and Soldatov, {A. I.} and Dementiev, {A. A.} and Soldatov, {A. A.} and A. Abouellaill",

year = "2020",

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AU - Vasiliev, I. M.

AU - Soldatov, A. I.

AU - Dementiev, A. A.

AU - Soldatov, A. A.

AU - Abouellaill, A.

PY - 2020/6/11

Y1 - 2020/6/11

N2 - This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.

AB - This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.

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T2 - 8th International Conference on Actual Trends in Radiophysics

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Automatic device for testing thermal resistance with thermoelectric effect

Abstract

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