Abstract
This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.
| Original language | English |
|---|---|
| Article number | 012047 |
| Journal | Journal of Physics: Conference Series |
| Volume | 1499 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 11 Jun 2020 |
| Event | 8th International Conference on Actual Trends in Radiophysics - Tomsk, Russian Federation Duration: 1 Oct 2019 → 4 Oct 2019 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
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Vasiliev, I. M., Soldatov, A. I., Dementiev, A. A., Soldatov, A. A., & Abouellaill, A. (2020). Automatic device for testing thermal resistance with thermoelectric effect. Journal of Physics: Conference Series, 1499(1), [012047]. https://doi.org/10.1088/1742-6596/1499/1/012047