Automatic device for testing thermal resistance with thermoelectric effect

I. M. Vasiliev, A. I. Soldatov, A. A. Dementiev, A. A. Soldatov, A. Abouellaill

Research output: Contribution to journalConference article

Abstract

This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.

Original languageEnglish
Article number012047
JournalJournal of Physics: Conference Series
Volume1499
Issue number1
DOIs
Publication statusPublished - 11 Jun 2020
Event8th International Conference on Actual Trends in Radiophysics - Tomsk, Russian Federation
Duration: 1 Oct 20194 Oct 2019

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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