Automatic device for testing thermal resistance with thermoelectric effect

I. M. Vasiliev, A. I. Soldatov, A. A. Dementiev, A. A. Soldatov, A. Abouellaill

Division for Electronic Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.

Original language	English
Article number	012047
Journal	Journal of Physics: Conference Series
Volume	1499
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/1499/1/012047
Publication status	Published - 11 Jun 2020
Event	8th International Conference on Actual Trends in Radiophysics - Tomsk, Russian Federation Duration: 1 Oct 2019 → 4 Oct 2019

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1088/1742-6596/1499/1/012047

Fingerprint Dive into the research topics of 'Automatic device for testing thermal resistance with thermoelectric effect'. Together they form a unique fingerprint.

Cite this

@article{891ceb989c7e4faa8291aa318f68316c,

title = "Automatic device for testing thermal resistance with thermoelectric effect",

abstract = "This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.",

author = "Vasiliev, {I. M.} and Soldatov, {A. I.} and Dementiev, {A. A.} and Soldatov, {A. A.} and A. Abouellaill",

year = "2020",

month = jun,

day = "11",

doi = "10.1088/1742-6596/1499/1/012047",

language = "English",

volume = "1499",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing Ltd.",

number = "1",

note = "8th International Conference on Actual Trends in Radiophysics ; Conference date: 01-10-2019 Through 04-10-2019",

}

TY - JOUR

T1 - Automatic device for testing thermal resistance with thermoelectric effect

AU - Vasiliev, I. M.

AU - Soldatov, A. I.

AU - Dementiev, A. A.

AU - Soldatov, A. A.

AU - Abouellaill, A.

PY - 2020/6/11

Y1 - 2020/6/11

N2 - This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.

AB - This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.

UR - http://www.scopus.com/inward/record.url?scp=85086718706&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85086718706&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/1499/1/012047

DO - 10.1088/1742-6596/1499/1/012047

M3 - Conference article

AN - SCOPUS:85086718706

VL - 1499

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 1

M1 - 012047

T2 - 8th International Conference on Actual Trends in Radiophysics

Y2 - 1 October 2019 through 4 October 2019

ER -