This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.
|Journal||Journal of Physics: Conference Series|
|Publication status||Published - 11 Jun 2020|
|Event||8th International Conference on Actual Trends in Radiophysics - Tomsk, Russian Federation|
Duration: 1 Oct 2019 → 4 Oct 2019
ASJC Scopus subject areas
- Physics and Astronomy(all)