Application of the method of secondary-ion mass spectroscopy to the study of heterodifusion in alkali-halide crystals

S. A. Gyngazov, Anatoly Petrovich Surzhikov, T. S. Frangul'yan, A. V. Chernyavskii

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The present paper gives the results of investigations of the high-temperature diffusion of Na and Mg ions into single crystals of potassium bromide by the method of secondary-ion mass spectrometry (SIMS). It is demonstrated that the diffusion profiles are nonelementary in character, and the diffusion in the near-surface layer is decelerated. To determine the volume diffusion coefficient, the diffusion profiles must be approximated for depths ≥1 μm. The efficiency of the procedure for determining the diffusion coefficient is confirmed by a comparison of the diffusion coefficients for Na ions determined in the present work with their values obtained by other methods having high reliability and measurement accuracy. The diffusion coefficients of the magnesium impurity are determined for various initial chemical states.

Original languageEnglish
Pages (from-to)753-758
Number of pages6
JournalRussian Physics Journal
Volume45
Issue number8
Publication statusPublished - 2002

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alkali halides
mass spectroscopy
diffusion coefficient
crystals
ions
potassium bromides
profiles
secondary ion mass spectrometry
magnesium
surface layers
impurities
single crystals

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Application of the method of secondary-ion mass spectroscopy to the study of heterodifusion in alkali-halide crystals. / Gyngazov, S. A.; Surzhikov, Anatoly Petrovich; Frangul'yan, T. S.; Chernyavskii, A. V.

In: Russian Physics Journal, Vol. 45, No. 8, 2002, p. 753-758.

Research output: Contribution to journalArticle

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