Application of the fractal dimension for estimating surface images obtained by various detectors

S. V. Panin, Yu A. Altukhov, P. S. Lyubutin, A. V. Byakov, S. A. Khizhnyak

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3 Citations (Scopus)


The influence of various methods of obtaining surface images on the calculated value of their fractal dimension as a quantitative characteristic of the surface state is studied. It is demonstrated that images obtained both by a scanning electron microscope and by a photocamera are characterized by a noticeable noise level, which alters the behavior of the fractal dimension. Various methods of correction of the observed effect are discussed.

Original languageEnglish
Pages (from-to)34-40
Number of pages7
JournalOptoelectronics, Instrumentation and Data Processing
Issue number1
Publication statusPublished - 2013



  • filtration
  • fractal dimension
  • image processing
  • noise
  • optical image

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Instrumentation

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