Application of the fractal dimension for estimating surface images obtained by various detectors

S. V. Panin, Yu A. Altukhov, P. S. Lyubutin, A. V. Byakov, S. A. Khizhnyak

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The influence of various methods of obtaining surface images on the calculated value of their fractal dimension as a quantitative characteristic of the surface state is studied. It is demonstrated that images obtained both by a scanning electron microscope and by a photocamera are characterized by a noticeable noise level, which alters the behavior of the fractal dimension. Various methods of correction of the observed effect are discussed.

Original languageEnglish
Pages (from-to)34-40
Number of pages7
JournalOptoelectronics, Instrumentation and Data Processing
Volume49
Issue number1
DOIs
Publication statusPublished - 2013

Fingerprint

Fractal dimension
fractals
estimating
Detectors
detectors
Surface states
Electron microscopes
electron microscopes
Scanning
scanning

Keywords

  • filtration
  • fractal dimension
  • image processing
  • noise
  • optical image

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Instrumentation

Cite this

Application of the fractal dimension for estimating surface images obtained by various detectors. / Panin, S. V.; Altukhov, Yu A.; Lyubutin, P. S.; Byakov, A. V.; Khizhnyak, S. A.

In: Optoelectronics, Instrumentation and Data Processing, Vol. 49, No. 1, 2013, p. 34-40.

Research output: Contribution to journalArticle

Panin, S. V. ; Altukhov, Yu A. ; Lyubutin, P. S. ; Byakov, A. V. ; Khizhnyak, S. A. / Application of the fractal dimension for estimating surface images obtained by various detectors. In: Optoelectronics, Instrumentation and Data Processing. 2013 ; Vol. 49, No. 1. pp. 34-40.
@article{f910eadc9a964fdaa500fd5713883679,
title = "Application of the fractal dimension for estimating surface images obtained by various detectors",
abstract = "The influence of various methods of obtaining surface images on the calculated value of their fractal dimension as a quantitative characteristic of the surface state is studied. It is demonstrated that images obtained both by a scanning electron microscope and by a photocamera are characterized by a noticeable noise level, which alters the behavior of the fractal dimension. Various methods of correction of the observed effect are discussed.",
keywords = "filtration, fractal dimension, image processing, noise, optical image",
author = "Panin, {S. V.} and Altukhov, {Yu A.} and Lyubutin, {P. S.} and Byakov, {A. V.} and Khizhnyak, {S. A.}",
year = "2013",
doi = "10.3103/S8756699013010056",
language = "English",
volume = "49",
pages = "34--40",
journal = "Optoelectronics, Instrumentation and Data Processing",
issn = "8756-6990",
publisher = "Allerton Press Inc.",
number = "1",

}

TY - JOUR

T1 - Application of the fractal dimension for estimating surface images obtained by various detectors

AU - Panin, S. V.

AU - Altukhov, Yu A.

AU - Lyubutin, P. S.

AU - Byakov, A. V.

AU - Khizhnyak, S. A.

PY - 2013

Y1 - 2013

N2 - The influence of various methods of obtaining surface images on the calculated value of their fractal dimension as a quantitative characteristic of the surface state is studied. It is demonstrated that images obtained both by a scanning electron microscope and by a photocamera are characterized by a noticeable noise level, which alters the behavior of the fractal dimension. Various methods of correction of the observed effect are discussed.

AB - The influence of various methods of obtaining surface images on the calculated value of their fractal dimension as a quantitative characteristic of the surface state is studied. It is demonstrated that images obtained both by a scanning electron microscope and by a photocamera are characterized by a noticeable noise level, which alters the behavior of the fractal dimension. Various methods of correction of the observed effect are discussed.

KW - filtration

KW - fractal dimension

KW - image processing

KW - noise

KW - optical image

UR - http://www.scopus.com/inward/record.url?scp=84876016520&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84876016520&partnerID=8YFLogxK

U2 - 10.3103/S8756699013010056

DO - 10.3103/S8756699013010056

M3 - Article

VL - 49

SP - 34

EP - 40

JO - Optoelectronics, Instrumentation and Data Processing

JF - Optoelectronics, Instrumentation and Data Processing

SN - 8756-6990

IS - 1

ER -