Abstract
Methodological features of an investigation of the defect structure of technically important materials by using positron annihilation are discussed. It is shown that the important annihilation parameters characterizing the positron-sensitive defects are the mean positron lifetime τ, the width of the annihilation photon correlation curves (APCC) at half the height Γ and the APCC form parameter f, and the linear Doppler broadening parameter of the annihilation γ-line S.
| Original language | English |
|---|---|
| Pages (from-to) | 413-416 |
| Number of pages | 4 |
| Journal | Soviet Physics Journal |
| Volume | 25 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - May 1982 |
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ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)
Cite this
Application of positron annihilation as a nondestructive method of checking the quality of materials. / Fedorov, V. A.; Prilipko, V. I.; Prokop'ev, E. P.; Aref'ev, K. P.
In: Soviet Physics Journal, Vol. 25, No. 5, 05.1982, p. 413-416.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Application of positron annihilation as a nondestructive method of checking the quality of materials
AU - Fedorov, V. A.
AU - Prilipko, V. I.
AU - Prokop'ev, E. P.
AU - Aref'ev, K. P.
PY - 1982/5
Y1 - 1982/5
N2 - Methodological features of an investigation of the defect structure of technically important materials by using positron annihilation are discussed. It is shown that the important annihilation parameters characterizing the positron-sensitive defects are the mean positron lifetime τ, the width of the annihilation photon correlation curves (APCC) at half the height Γ and the APCC form parameter f, and the linear Doppler broadening parameter of the annihilation γ-line S.
AB - Methodological features of an investigation of the defect structure of technically important materials by using positron annihilation are discussed. It is shown that the important annihilation parameters characterizing the positron-sensitive defects are the mean positron lifetime τ, the width of the annihilation photon correlation curves (APCC) at half the height Γ and the APCC form parameter f, and the linear Doppler broadening parameter of the annihilation γ-line S.
UR - http://www.scopus.com/inward/record.url?scp=0020126413&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0020126413&partnerID=8YFLogxK
U2 - 10.1007/BF00891761
DO - 10.1007/BF00891761
M3 - Article
VL - 25
SP - 413
EP - 416
JO - Russian Physics Journal
JF - Russian Physics Journal
SN - 1064-8887
IS - 5
ER -