Application of positron annihilation as a nondestructive method of checking the quality of materials

V. A. Fedorov, V. I. Prilipko, E. P. Prokop'ev, K. P. Aref'ev

Division for Mathematics and Computer Sciences

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Abstract

Methodological features of an investigation of the defect structure of technically important materials by using positron annihilation are discussed. It is shown that the important annihilation parameters characterizing the positron-sensitive defects are the mean positron lifetime τ, the width of the annihilation photon correlation curves (APCC) at half the height Γ and the APCC form parameter f, and the linear Doppler broadening parameter of the annihilation γ-line S.

Original language	English
Pages (from-to)	413-416
Number of pages	4
Journal	Soviet Physics Journal
Volume	25
Issue number	5
DOIs	https://doi.org/10.1007/BF00891761
Publication status	Published - May 1982

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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title = "Application of positron annihilation as a nondestructive method of checking the quality of materials",

abstract = "Methodological features of an investigation of the defect structure of technically important materials by using positron annihilation are discussed. It is shown that the important annihilation parameters characterizing the positron-sensitive defects are the mean positron lifetime τ, the width of the annihilation photon correlation curves (APCC) at half the height Γ and the APCC form parameter f, and the linear Doppler broadening parameter of the annihilation γ-line S.",

author = "Fedorov, {V. A.} and Prilipko, {V. I.} and Prokop'ev, {E. P.} and Aref'ev, {K. P.}",

year = "1982",

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T1 - Application of positron annihilation as a nondestructive method of checking the quality of materials

AU - Fedorov, V. A.

AU - Prilipko, V. I.

AU - Prokop'ev, E. P.

AU - Aref'ev, K. P.

PY - 1982/5

Y1 - 1982/5

N2 - Methodological features of an investigation of the defect structure of technically important materials by using positron annihilation are discussed. It is shown that the important annihilation parameters characterizing the positron-sensitive defects are the mean positron lifetime τ, the width of the annihilation photon correlation curves (APCC) at half the height Γ and the APCC form parameter f, and the linear Doppler broadening parameter of the annihilation γ-line S.

AB - Methodological features of an investigation of the defect structure of technically important materials by using positron annihilation are discussed. It is shown that the important annihilation parameters characterizing the positron-sensitive defects are the mean positron lifetime τ, the width of the annihilation photon correlation curves (APCC) at half the height Γ and the APCC form parameter f, and the linear Doppler broadening parameter of the annihilation γ-line S.

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Application of positron annihilation as a nondestructive method of checking the quality of materials

Abstract

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