Abstract
Methodological features of an investigation of the defect structure of technically important materials by using positron annihilation are discussed. It is shown that the important annihilation parameters characterizing the positron-sensitive defects are the mean positron lifetime τ, the width of the annihilation photon correlation curves (APCC) at half the height Γ and the APCC form parameter f, and the linear Doppler broadening parameter of the annihilation γ-line S.
Original language | English |
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Pages (from-to) | 413-416 |
Number of pages | 4 |
Journal | Soviet Physics Journal |
Volume | 25 |
Issue number | 5 |
DOIs | |
Publication status | Published - May 1982 |
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)