Application of polycapillary optics for dual energy spectroscopy based on a laboratory source

Yu Cherepennikov, I. Miloichikova, A. Gogolev, S. Stuchebrov, D. Hampai, S. Dabagov, A. Liedl

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

This paper describes experimental investigation aimed at the development of X-ray tube based source with a spectrum characterized by two different monochromatic lines (double-line spectrum). The modification of the tube spectrum to be a double-line one is suggested by means of a two crystals kit. The possibility to increase the beam intensity was experimentally studied via the use of a polycapillary semilens that collects divergent X-ray radiation from the source.

Original languageEnglish
Pages (from-to)278-281
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume402
DOIs
Publication statusPublished - 1 Jul 2017

Fingerprint

X ray tubes
Optics
Spectroscopy
optics
tubes
Radiation
X rays
Crystals
kits
spectroscopy
line spectra
x rays
energy
radiation
crystals

Keywords

  • Polycapillary optics
  • Wave dispersive analysis
  • X-ray diffraction

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

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keywords = "Polycapillary optics, Wave dispersive analysis, X-ray diffraction",
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AU - Cherepennikov, Yu

AU - Miloichikova, I.

AU - Gogolev, A.

AU - Stuchebrov, S.

AU - Hampai, D.

AU - Dabagov, S.

AU - Liedl, A.

PY - 2017/7/1

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AB - This paper describes experimental investigation aimed at the development of X-ray tube based source with a spectrum characterized by two different monochromatic lines (double-line spectrum). The modification of the tube spectrum to be a double-line one is suggested by means of a two crystals kit. The possibility to increase the beam intensity was experimentally studied via the use of a polycapillary semilens that collects divergent X-ray radiation from the source.

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KW - Wave dispersive analysis

KW - X-ray diffraction

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