Abstract
Residual stresses appeared with time due to the imperfection of the material production process. Sometimes the redistribution of residual stresses is the reason of cracks initiation in the tested object on one of the manufacturing stages or this redistribution increases them up to the critical value, when a small external load results in breakage of this object. Relaxation is the main reason of redistribution of residual stresses and it can occur without external influence or if there is heating, static and cyclic loads. Relaxation results in change of the sizes and shapes of the tested object. The dimensional stability is especially important in modern high technologies, in particular in the use of compact discs for the storage of information. Modern CDs are produced from polycarbonate, possessing an effect of birefringence. It allows to make an estimation of stresses at CDs by the method of photoelasticity. A metallized coating put on one of a CD surfaces provides ideal conditions for registration of interference picture observed in the reflected light. When investigating the stresses in CDs with the use of reflective V-type plane polariscope the solving equations become similar to those used in a photoelastic coating method. The present work discusses the results of the research of the residual stresses in CDs with various operation time produced by various firms and by different technologies (punching, laser recording). A simple optical method of the NDT of CDs at various stages of their manufacturing is offered.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Editors | Y.V. Chugui, S.N. Bagayev, A. Weckenmann, P.H. Osanna |
| Pages | 606-610 |
| Number of pages | 5 |
| Volume | 4900 |
| Edition | 1 |
| DOIs | |
| Publication status | Published - 2002 |
| Event | Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russian Federation Duration: 9 Sep 2002 → 13 Sep 2002 |
Other
| Other | Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life |
|---|---|
| Country | Russian Federation |
| City | Novosibirsk |
| Period | 9.9.02 → 13.9.02 |
Fingerprint
Keywords
- CD
- Photoelasticity
- Residual stresses
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
Cite this
Application of photoelasticity for analysis of residual stresses in CDs. / Gerasimov, S. I.; Bachurina, N. S.; Emelyanova, N. N.
Proceedings of SPIE - The International Society for Optical Engineering. ed. / Y.V. Chugui; S.N. Bagayev; A. Weckenmann; P.H. Osanna. Vol. 4900 1. ed. 2002. p. 606-610.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Application of photoelasticity for analysis of residual stresses in CDs
AU - Gerasimov, S. I.
AU - Bachurina, N. S.
AU - Emelyanova, N. N.
PY - 2002
Y1 - 2002
N2 - Residual stresses appeared with time due to the imperfection of the material production process. Sometimes the redistribution of residual stresses is the reason of cracks initiation in the tested object on one of the manufacturing stages or this redistribution increases them up to the critical value, when a small external load results in breakage of this object. Relaxation is the main reason of redistribution of residual stresses and it can occur without external influence or if there is heating, static and cyclic loads. Relaxation results in change of the sizes and shapes of the tested object. The dimensional stability is especially important in modern high technologies, in particular in the use of compact discs for the storage of information. Modern CDs are produced from polycarbonate, possessing an effect of birefringence. It allows to make an estimation of stresses at CDs by the method of photoelasticity. A metallized coating put on one of a CD surfaces provides ideal conditions for registration of interference picture observed in the reflected light. When investigating the stresses in CDs with the use of reflective V-type plane polariscope the solving equations become similar to those used in a photoelastic coating method. The present work discusses the results of the research of the residual stresses in CDs with various operation time produced by various firms and by different technologies (punching, laser recording). A simple optical method of the NDT of CDs at various stages of their manufacturing is offered.
AB - Residual stresses appeared with time due to the imperfection of the material production process. Sometimes the redistribution of residual stresses is the reason of cracks initiation in the tested object on one of the manufacturing stages or this redistribution increases them up to the critical value, when a small external load results in breakage of this object. Relaxation is the main reason of redistribution of residual stresses and it can occur without external influence or if there is heating, static and cyclic loads. Relaxation results in change of the sizes and shapes of the tested object. The dimensional stability is especially important in modern high technologies, in particular in the use of compact discs for the storage of information. Modern CDs are produced from polycarbonate, possessing an effect of birefringence. It allows to make an estimation of stresses at CDs by the method of photoelasticity. A metallized coating put on one of a CD surfaces provides ideal conditions for registration of interference picture observed in the reflected light. When investigating the stresses in CDs with the use of reflective V-type plane polariscope the solving equations become similar to those used in a photoelastic coating method. The present work discusses the results of the research of the residual stresses in CDs with various operation time produced by various firms and by different technologies (punching, laser recording). A simple optical method of the NDT of CDs at various stages of their manufacturing is offered.
KW - CD
KW - Photoelasticity
KW - Residual stresses
UR - http://www.scopus.com/inward/record.url?scp=0036450087&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0036450087&partnerID=8YFLogxK
U2 - 10.1117/12.484619
DO - 10.1117/12.484619
M3 - Conference contribution
AN - SCOPUS:0036450087
VL - 4900
SP - 606
EP - 610
BT - Proceedings of SPIE - The International Society for Optical Engineering
A2 - Chugui, Y.V.
A2 - Bagayev, S.N.
A2 - Weckenmann, A.
A2 - Osanna, P.H.
ER -