Abstract
The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10-5-10-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.
| Original language | English |
|---|---|
| Pages (from-to) | 266-270 |
| Number of pages | 5 |
| Journal | The Soviet journal of nondestructive testing |
| Volume | 26 |
| Issue number | 4 |
| Publication status | Published - Dec 1990 |
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ASJC Scopus subject areas
- Engineering(all)
Cite this
Application of electron-optical transducers in thermal nondestructive inspection. / Barke, V. E.; Vavilov, V. P.; Kosilov, M. S.; Kosilov, N. S.
In: The Soviet journal of nondestructive testing, Vol. 26, No. 4, 12.1990, p. 266-270.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Application of electron-optical transducers in thermal nondestructive inspection
AU - Barke, V. E.
AU - Vavilov, V. P.
AU - Kosilov, M. S.
AU - Kosilov, N. S.
PY - 1990/12
Y1 - 1990/12
N2 - The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10-5-10-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.
AB - The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10-5-10-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.
UR - http://www.scopus.com/inward/record.url?scp=0025567216&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0025567216&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0025567216
VL - 26
SP - 266
EP - 270
JO - Soviet Journal of Nondestructive Testing
JF - Soviet Journal of Nondestructive Testing
SN - 0038-5492
IS - 4
ER -