The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10-5-10-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.
|Number of pages||5|
|Journal||The Soviet journal of nondestructive testing|
|Publication status||Published - Dec 1990|
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