Application of electron-optical transducers in thermal nondestructive inspection

V. E. Barke, V. P. Vavilov, M. S. Kosilov, N. S. Kosilov

Center for Industrial Tomography

Research output: Contribution to journal › Article › peer-review

Abstract

The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10^-5-10^-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.

Original language	English
Pages (from-to)	266-270
Number of pages	5
Journal	The Soviet journal of nondestructive testing
Volume	26
Issue number	4
Publication status	Published - Dec 1990

ASJC Scopus subject areas

Engineering(all)

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@article{0f30766b7ebd42eba599523c709542b1,

title = "Application of electron-optical transducers in thermal nondestructive inspection",

abstract = "The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10-5-10-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.",

author = "Barke, {V. E.} and Vavilov, {V. P.} and Kosilov, {M. S.} and Kosilov, {N. S.}",

year = "1990",

month = dec,

language = "English",

volume = "26",

pages = "266--270",

journal = "Soviet Journal of Nondestructive Testing",

issn = "0038-5492",

publisher = "Consultants Bureau",

number = "4",

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TY - JOUR

T1 - Application of electron-optical transducers in thermal nondestructive inspection

AU - Barke, V. E.

AU - Vavilov, V. P.

AU - Kosilov, M. S.

AU - Kosilov, N. S.

PY - 1990/12

Y1 - 1990/12

N2 - The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10-5-10-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.

AB - The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10-5-10-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.

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M3 - Article

AN - SCOPUS:0025567216

VL - 26

SP - 266

EP - 270

JO - Soviet Journal of Nondestructive Testing

JF - Soviet Journal of Nondestructive Testing

SN - 0038-5492

IS - 4

ER -

Application of electron-optical transducers in thermal nondestructive inspection

Abstract

ASJC Scopus subject areas

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