Abstract
The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10-5-10-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.
Original language | English |
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Pages (from-to) | 266-270 |
Number of pages | 5 |
Journal | The Soviet journal of nondestructive testing |
Volume | 26 |
Issue number | 4 |
Publication status | Published - Dec 1990 |
ASJC Scopus subject areas
- Engineering(all)