Application of electron-optical transducers in thermal nondestructive inspection

V. E. Barke, V. P. Vavilov, M. S. Kosilov, N. S. Kosilov

Research output: Contribution to journalArticle

Abstract

The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10-5-10-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.

Original languageEnglish
Pages (from-to)266-270
Number of pages5
JournalThe Soviet journal of nondestructive testing
Volume26
Issue number4
Publication statusPublished - Dec 1990

Fingerprint

Transducers
Inspection
Electrons
Detectors
Temperature
Defects
Testing
Hot Temperature

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Application of electron-optical transducers in thermal nondestructive inspection. / Barke, V. E.; Vavilov, V. P.; Kosilov, M. S.; Kosilov, N. S.

In: The Soviet journal of nondestructive testing, Vol. 26, No. 4, 12.1990, p. 266-270.

Research output: Contribution to journalArticle

@article{0f30766b7ebd42eba599523c709542b1,
title = "Application of electron-optical transducers in thermal nondestructive inspection",
abstract = "The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10-5-10-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.",
author = "Barke, {V. E.} and Vavilov, {V. P.} and Kosilov, {M. S.} and Kosilov, {N. S.}",
year = "1990",
month = "12",
language = "English",
volume = "26",
pages = "266--270",
journal = "Soviet Journal of Nondestructive Testing",
issn = "0038-5492",
publisher = "Consultants Bureau",
number = "4",

}

TY - JOUR

T1 - Application of electron-optical transducers in thermal nondestructive inspection

AU - Barke, V. E.

AU - Vavilov, V. P.

AU - Kosilov, M. S.

AU - Kosilov, N. S.

PY - 1990/12

Y1 - 1990/12

N2 - The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10-5-10-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.

AB - The article describes a method of calculating the threshold temperature and the temperature resolution of electron-optical transducers with illuminance threshold 10-5-10-6 1x. It is shown theoretically and experimentally that there transducers can be used as thermal flaw detectors for testing objects more than 250°C hot.

UR - http://www.scopus.com/inward/record.url?scp=0025567216&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0025567216&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0025567216

VL - 26

SP - 266

EP - 270

JO - Soviet Journal of Nondestructive Testing

JF - Soviet Journal of Nondestructive Testing

SN - 0038-5492

IS - 4

ER -