Abstract
At present detectors characterized by non-constant spatial sensitivity to incident radiation, at least in one dimension (in a plane of controlled section), are used for some scanning systems of radiation control, in particular for systems of X-ray computer tomography. Dissimilar response to radiation in the present detectors results from use of radiation-sensitive element in the form of three-crystal set with different efficiency of registration (the central crystal has more efficient registration in comparison with side crystals). There is another way to obtain non-uniform response - irregular optic enhancement of light flux from the scintillator surface. These detectors, in comparison with traditional ones with uniform spatial sensitivity, allow increasing ultimate spatial resolution of control system without changing noise level. Within the frames of this field we have considered detectors in the form of arbitrary configuration (symmetrical one is not of necessity) composed of three scintillation crystals with equal size in the scanning direction and different thickness (sizes in the incident radiation direction). We have obtained proportions for choosing detector crystal thickness that provide the possibility of maintenance of high ultimate resolution of the control system without changing noise level.
| Original language | English |
|---|---|
| Title of host publication | 5th Korea-Russia International Symposium on Science and Technology - Proceedings |
| Subtitle of host publication | KORUS 2001 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 373-374 |
| Number of pages | 2 |
| Volume | 1 |
| ISBN (Electronic) | 0780370082, 9780780370081 |
| DOIs | |
| Publication status | Published - 1 Jan 2001 |
| Event | 5th Korea-Russia International Symposium on Science and Technology, KORUS 2001 - Tomsk, Russian Federation Duration: 26 Jun 2001 → 3 Jul 2001 |
Conference
| Conference | 5th Korea-Russia International Symposium on Science and Technology, KORUS 2001 |
|---|---|
| Country | Russian Federation |
| City | Tomsk |
| Period | 26.6.01 → 3.7.01 |
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Keywords
- non-uniform spatial sensitivity
- radiation control
- scanning systems
ASJC Scopus subject areas
- Clinical Biochemistry
- Computer Networks and Communications
- Biotechnology
- Civil and Structural Engineering
- Mechanics of Materials
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Surfaces, Coatings and Films
Cite this
Application efficiency of detector with non-uniform spatial sensitivity in scanning systems of radiation control. / Temnik, A.; Udod, V.
5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001. Vol. 1 Institute of Electrical and Electronics Engineers Inc., 2001. p. 373-374 975155.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Application efficiency of detector with non-uniform spatial sensitivity in scanning systems of radiation control
AU - Temnik, A.
AU - Udod, V.
PY - 2001/1/1
Y1 - 2001/1/1
N2 - At present detectors characterized by non-constant spatial sensitivity to incident radiation, at least in one dimension (in a plane of controlled section), are used for some scanning systems of radiation control, in particular for systems of X-ray computer tomography. Dissimilar response to radiation in the present detectors results from use of radiation-sensitive element in the form of three-crystal set with different efficiency of registration (the central crystal has more efficient registration in comparison with side crystals). There is another way to obtain non-uniform response - irregular optic enhancement of light flux from the scintillator surface. These detectors, in comparison with traditional ones with uniform spatial sensitivity, allow increasing ultimate spatial resolution of control system without changing noise level. Within the frames of this field we have considered detectors in the form of arbitrary configuration (symmetrical one is not of necessity) composed of three scintillation crystals with equal size in the scanning direction and different thickness (sizes in the incident radiation direction). We have obtained proportions for choosing detector crystal thickness that provide the possibility of maintenance of high ultimate resolution of the control system without changing noise level.
AB - At present detectors characterized by non-constant spatial sensitivity to incident radiation, at least in one dimension (in a plane of controlled section), are used for some scanning systems of radiation control, in particular for systems of X-ray computer tomography. Dissimilar response to radiation in the present detectors results from use of radiation-sensitive element in the form of three-crystal set with different efficiency of registration (the central crystal has more efficient registration in comparison with side crystals). There is another way to obtain non-uniform response - irregular optic enhancement of light flux from the scintillator surface. These detectors, in comparison with traditional ones with uniform spatial sensitivity, allow increasing ultimate spatial resolution of control system without changing noise level. Within the frames of this field we have considered detectors in the form of arbitrary configuration (symmetrical one is not of necessity) composed of three scintillation crystals with equal size in the scanning direction and different thickness (sizes in the incident radiation direction). We have obtained proportions for choosing detector crystal thickness that provide the possibility of maintenance of high ultimate resolution of the control system without changing noise level.
KW - non-uniform spatial sensitivity
KW - radiation control
KW - scanning systems
UR - http://www.scopus.com/inward/record.url?scp=84961859512&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84961859512&partnerID=8YFLogxK
U2 - 10.1109/KORUS.2001.975155
DO - 10.1109/KORUS.2001.975155
M3 - Conference contribution
VL - 1
SP - 373
EP - 374
BT - 5th Korea-Russia International Symposium on Science and Technology - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
ER -