Angular distributions of diffracted X-ray radiation from channeled electrons in Si and LiF Crystals: Influence of energy levels band structure

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

It is shown that the band structure of the energy levels of planar channeled electrons qualitatively changes the angular distributions of X-rays emitted at Bragg angles.

Original languageEnglish
Pages (from-to)3753-3757
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume266
Issue number17
DOIs
Publication statusPublished - Sep 2008

Keywords

  • 41.60.-m
  • 61.85.+p
  • 78.70.-g
  • Channeling X-ray radiation
  • Diffracted channeling radiation
  • Planar channeling

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Fingerprint Dive into the research topics of 'Angular distributions of diffracted X-ray radiation from channeled electrons in Si and LiF Crystals: Influence of energy levels band structure'. Together they form a unique fingerprint.

  • Cite this