Abstract
It is shown that the band structure of the energy levels of planar channeled electrons qualitatively changes the angular distributions of X-rays emitted at Bragg angles.
| Original language | English |
|---|---|
| Pages (from-to) | 3753-3757 |
| Number of pages | 5 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 266 |
| Issue number | 17 |
| DOIs | |
| Publication status | Published - Sep 2008 |
Keywords
- 41.60.-m
- 61.85.+p
- 78.70.-g
- Channeling X-ray radiation
- Diffracted channeling radiation
- Planar channeling
ASJC Scopus subject areas
- Surfaces, Coatings and Films
- Instrumentation
- Surfaces and Interfaces
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Korotchenko, K. B., Pivovarov, Y. L., & Tukhfatullin, T. A. (2008). Angular distributions of diffracted X-ray radiation from channeled electrons in Si and LiF Crystals: Influence of energy levels band structure. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 266(17), 3753-3757. https://doi.org/10.1016/j.nimb.2008.03.203