Angular distribution of the soft component of radiation from relativistic electrons near planar orientation in thick single crystals

K. Yu Amosov, M. Yu Andreyashkin, I. E. Vnukov, B. N. Kalinin, G. A. Naumenko, A. P. Potylitsyn, V. P. Sarychev

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Abstract

The Tomsk synchrotron has been used to carry out an experimental study of the soft component (ω≲30 MeV) of the radiation from relativistic electrons in diamond, silicon, and tungsten single crystals. It is shown that a component of the radiation associated with channeling emission from electrons trapped inside the crystal can be distinguished because of angular selection. It is found that the linear density of the radiation from the electrons which must be trapped in planar channeling inside the crystal because of multiple scattering is substantially reduced in comparison with the linear density of the radiation from electrons trapped in this regime in the surface layer of the crystal. It is shown that the "quasirefraction" of an electron beam by the planar potential in thick single crystals leads to "effective reflection" of electrons.

Original languageEnglish
Pages (from-to)527-534
Number of pages8
JournalSoviet Physics Journal
Volume34
Issue number6
DOIs
Publication statusPublished - Jun 1991

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angular distribution
single crystals
radiation
electrons
crystals
surface layers
tungsten
synchrotrons
diamonds
electron beams
silicon
scattering

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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Angular distribution of the soft component of radiation from relativistic electrons near planar orientation in thick single crystals. / Amosov, K. Yu; Andreyashkin, M. Yu; Vnukov, I. E.; Kalinin, B. N.; Naumenko, G. A.; Potylitsyn, A. P.; Sarychev, V. P.

In: Soviet Physics Journal, Vol. 34, No. 6, 06.1991, p. 527-534.

Research output: Contribution to journalArticle

Amosov, K. Yu ; Andreyashkin, M. Yu ; Vnukov, I. E. ; Kalinin, B. N. ; Naumenko, G. A. ; Potylitsyn, A. P. ; Sarychev, V. P. / Angular distribution of the soft component of radiation from relativistic electrons near planar orientation in thick single crystals. In: Soviet Physics Journal. 1991 ; Vol. 34, No. 6. pp. 527-534.
@article{f97cb14dbb7644f5aecd74ec3197a940,
title = "Angular distribution of the soft component of radiation from relativistic electrons near planar orientation in thick single crystals",
abstract = "The Tomsk synchrotron has been used to carry out an experimental study of the soft component (ω≲30 MeV) of the radiation from relativistic electrons in diamond, silicon, and tungsten single crystals. It is shown that a component of the radiation associated with channeling emission from electrons trapped inside the crystal can be distinguished because of angular selection. It is found that the linear density of the radiation from the electrons which must be trapped in planar channeling inside the crystal because of multiple scattering is substantially reduced in comparison with the linear density of the radiation from electrons trapped in this regime in the surface layer of the crystal. It is shown that the {"}quasirefraction{"} of an electron beam by the planar potential in thick single crystals leads to {"}effective reflection{"} of electrons.",
author = "Amosov, {K. Yu} and Andreyashkin, {M. Yu} and Vnukov, {I. E.} and Kalinin, {B. N.} and Naumenko, {G. A.} and Potylitsyn, {A. P.} and Sarychev, {V. P.}",
year = "1991",
month = "6",
doi = "10.1007/BF00895884",
language = "English",
volume = "34",
pages = "527--534",
journal = "Russian Physics Journal",
issn = "1064-8887",
publisher = "Consultants Bureau",
number = "6",

}

TY - JOUR

T1 - Angular distribution of the soft component of radiation from relativistic electrons near planar orientation in thick single crystals

AU - Amosov, K. Yu

AU - Andreyashkin, M. Yu

AU - Vnukov, I. E.

AU - Kalinin, B. N.

AU - Naumenko, G. A.

AU - Potylitsyn, A. P.

AU - Sarychev, V. P.

PY - 1991/6

Y1 - 1991/6

N2 - The Tomsk synchrotron has been used to carry out an experimental study of the soft component (ω≲30 MeV) of the radiation from relativistic electrons in diamond, silicon, and tungsten single crystals. It is shown that a component of the radiation associated with channeling emission from electrons trapped inside the crystal can be distinguished because of angular selection. It is found that the linear density of the radiation from the electrons which must be trapped in planar channeling inside the crystal because of multiple scattering is substantially reduced in comparison with the linear density of the radiation from electrons trapped in this regime in the surface layer of the crystal. It is shown that the "quasirefraction" of an electron beam by the planar potential in thick single crystals leads to "effective reflection" of electrons.

AB - The Tomsk synchrotron has been used to carry out an experimental study of the soft component (ω≲30 MeV) of the radiation from relativistic electrons in diamond, silicon, and tungsten single crystals. It is shown that a component of the radiation associated with channeling emission from electrons trapped inside the crystal can be distinguished because of angular selection. It is found that the linear density of the radiation from the electrons which must be trapped in planar channeling inside the crystal because of multiple scattering is substantially reduced in comparison with the linear density of the radiation from electrons trapped in this regime in the surface layer of the crystal. It is shown that the "quasirefraction" of an electron beam by the planar potential in thick single crystals leads to "effective reflection" of electrons.

UR - http://www.scopus.com/inward/record.url?scp=0343387888&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0343387888&partnerID=8YFLogxK

U2 - 10.1007/BF00895884

DO - 10.1007/BF00895884

M3 - Article

VL - 34

SP - 527

EP - 534

JO - Russian Physics Journal

JF - Russian Physics Journal

SN - 1064-8887

IS - 6

ER -