Angular distribution of diffracted x rays from (111) channeled electrons in Si

The effect of the band structure of energy levels

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

It has been shown that the inclusion of the band structure of the energy levels of channeled electrons qualitatively changes the angular distributions of x rays at the Bragg angles, which can be useful for the experimental detection of the effect.

Original languageEnglish
Pages (from-to)555-559
Number of pages5
JournalJETP Letters
Volume85
Issue number11
DOIs
Publication statusPublished - Aug 2007

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Bragg angle
angular distribution
energy levels
inclusions
electrons
x rays

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

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title = "Angular distribution of diffracted x rays from (111) channeled electrons in Si: The effect of the band structure of energy levels",
abstract = "It has been shown that the inclusion of the band structure of the energy levels of channeled electrons qualitatively changes the angular distributions of x rays at the Bragg angles, which can be useful for the experimental detection of the effect.",
author = "Bogdanov, {O. V.} and Korotchenko, {K. B.} and Pivovarov, {Yu L.}",
year = "2007",
month = "8",
doi = "10.1134/S0021364007110069",
language = "English",
volume = "85",
pages = "555--559",
journal = "JETP Letters",
issn = "0021-3640",
publisher = "Maik Nauka-Interperiodica Publishing",
number = "11",

}

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T1 - Angular distribution of diffracted x rays from (111) channeled electrons in Si

T2 - The effect of the band structure of energy levels

AU - Bogdanov, O. V.

AU - Korotchenko, K. B.

AU - Pivovarov, Yu L.

PY - 2007/8

Y1 - 2007/8

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AB - It has been shown that the inclusion of the band structure of the energy levels of channeled electrons qualitatively changes the angular distributions of x rays at the Bragg angles, which can be useful for the experimental detection of the effect.

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U2 - 10.1134/S0021364007110069

DO - 10.1134/S0021364007110069

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JO - JETP Letters

JF - JETP Letters

SN - 0021-3640

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