Analysis of transient processes in SLED system

Research Laboratory for Super High Frequency Technology

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Abstract

The input and output of microwave energy in a SLED system are analyzed in detail by a scattering-matrix method. Analytic expressions are derived for the envelopes formed by the system of rf pulses that enter the load and supply the microwave generator. The dependences of the rf-power amplification of the system on the mismatch of the working frequencies and Q-factors of the storage resonators, their coupling factors with the rf supply circuits, the switching time of the supply-wave phase, and the phase difference of the waves in the waveguide channels of the resonators are determined.

Original language	English
Pages (from-to)	384-390
Number of pages	7
Journal	Radiophysics and Quantum Electronics
Volume	35
Issue number	6-7
DOIs	https://doi.org/10.1007/BF01041789
Publication status	Published - Jun 1992

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ASJC Scopus subject areas

Nuclear and High Energy Physics
Engineering(all)

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Artemenko, S. N. (1992). Analysis of transient processes in SLED system. Radiophysics and Quantum Electronics, 35(6-7), 384-390. https://doi.org/10.1007/BF01041789

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AB - The input and output of microwave energy in a SLED system are analyzed in detail by a scattering-matrix method. Analytic expressions are derived for the envelopes formed by the system of rf pulses that enter the load and supply the microwave generator. The dependences of the rf-power amplification of the system on the mismatch of the working frequencies and Q-factors of the storage resonators, their coupling factors with the rf supply circuits, the switching time of the supply-wave phase, and the phase difference of the waves in the waveguide channels of the resonators are determined.

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Access to Document

10.1007/BF01041789