An ellipsometric study of polyamide and polyimide langmuir-blodgett films

S. N. Shtykov, B. N. Klimov, D. A. Gorin, M. A. Gets'man, K. E. Pankin

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Abstract

Ellipsometry in conjunction with the Ψ-Δ-nomogram method was used to determine the thickness per monolayer and refractive index of Langmuir-Blodgett (LB) films prepared from dimethyloctadecylammonium salt of polyamide acid (S) and polyimide films obtained by the thermal imidization of S. Before imidization, the thickness per monolayer and refractive index of the LB film were 1.8 ± 0.2 nm and 1.500 ± 0.016, respectively; after imidization, these parameters changed to 0.5 ± 0.1 nm and 1.685 ± 0.038. The refractive index of the polyamide LB film was found to increase with the number of monolayers.

Original languageEnglish
Pages (from-to)416-419
Number of pages4
JournalRussian Journal of Physical Chemistry A
Volume78
Issue number3
Publication statusPublished - Mar 2004
Externally publishedYes

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry

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  • Cite this

    Shtykov, S. N., Klimov, B. N., Gorin, D. A., Gets'man, M. A., & Pankin, K. E. (2004). An ellipsometric study of polyamide and polyimide langmuir-blodgett films. Russian Journal of Physical Chemistry A, 78(3), 416-419.