Abstract
Ellipsometry in conjunction with the Ψ-Δ-nomogram method was used to determine the thickness per monolayer and refractive index of Langmuir-Blodgett (LB) films prepared from dimethyloctadecylammonium salt of polyamide acid (S) and polyimide films obtained by the thermal imidization of S. Before imidization, the thickness per monolayer and refractive index of the LB film were 1.8 ± 0.2 nm and 1.500 ± 0.016, respectively; after imidization, these parameters changed to 0.5 ± 0.1 nm and 1.685 ± 0.038. The refractive index of the polyamide LB film was found to increase with the number of monolayers.
| Original language | English |
|---|---|
| Pages (from-to) | 416-419 |
| Number of pages | 4 |
| Journal | Russian Journal of Physical Chemistry A |
| Volume | 78 |
| Issue number | 3 |
| Publication status | Published - Mar 2004 |
| Externally published | Yes |
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
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Shtykov, S. N., Klimov, B. N., Gorin, D. A., Gets'man, M. A., & Pankin, K. E. (2004). An ellipsometric study of polyamide and polyimide langmuir-blodgett films. Russian Journal of Physical Chemistry A, 78(3), 416-419.