An Automated Algorithm for Constructing Maps of Defects in Active Thermal Testing

Research output: Contribution to journalArticle

Abstract

Abstract: The algorithm makes it possible to simplify the procedure for processing results of the thermal testing aimed at both revealing latent defects and evaluating their transverse dimensions and shape. Applying this algorithm requires certain participation and experience of the thermography operator, as well as preliminary preparation of initial data by using techniques that increase the signal-to-noise ratio. The algorithm includes selection of defective zones on the thermogram of the test object, automated identification of points with extreme signals, and a pixel-by-pixel threshold analysis of the zones adjacent to these points, culminating in the construction of binary defect maps.

Original languageEnglish
Pages (from-to)617-621
Number of pages5
JournalRussian Journal of Nondestructive Testing
Volume55
Issue number8
DOIs
Publication statusPublished - 1 Aug 2019

Fingerprint

Defects
defects
Testing
Pixels
pixels
thermograms
Signal to noise ratio
signal to noise ratios
operators
preparation
thresholds
Processing
Hot Temperature

Keywords

  • automated testing
  • composite materials
  • infrared thermography
  • thermal testing
  • transverse defect size

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

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AB - Abstract: The algorithm makes it possible to simplify the procedure for processing results of the thermal testing aimed at both revealing latent defects and evaluating their transverse dimensions and shape. Applying this algorithm requires certain participation and experience of the thermography operator, as well as preliminary preparation of initial data by using techniques that increase the signal-to-noise ratio. The algorithm includes selection of defective zones on the thermogram of the test object, automated identification of points with extreme signals, and a pixel-by-pixel threshold analysis of the zones adjacent to these points, culminating in the construction of binary defect maps.

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