Ageing test results of low voltage MOSFET modules for electrical vehicles

Laurent Dupont, Stéphane Lefebvre, Mounira Bouaroudj, Zoubir Khatir, Jean Claude Faugières, Francis Emorine

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Abstract

HEV is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive / active thermal cycle ageing must be evaluated. Authors present first results on ageing and failure modes for a 75V/350A MOSFET module from a low voltage / cycled DC current test bench. Bond wires are used for electrical connections between dies and between dies and DCB substrates. For this kind of low voltage and high current module, the main lifetime limitation at high temperature is related to the electric connexions.

Original languageEnglish
Title of host publication2007 European Conference on Power Electronics and Applications, EPE
DOIs
Publication statusPublished - 1 Dec 2007
Externally publishedYes
Event2007 European Conference on Power Electronics and Applications, EPE - Aalborg, Denmark
Duration: 2 Sep 20075 Sep 2007

Publication series

Name2007 European Conference on Power Electronics and Applications, EPE

Conference

Conference2007 European Conference on Power Electronics and Applications, EPE
CountryDenmark
CityAalborg
Period2.9.075.9.07

Keywords

  • Automotive application
  • High temperature electronics
  • Hybrid power integration
  • MOSFET
  • Packaging
  • Power cycling
  • Power semiconductor device
  • Reliability
  • Test bench
  • Thermal stress

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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  • Cite this

    Dupont, L., Lefebvre, S., Bouaroudj, M., Khatir, Z., Faugières, J. C., & Emorine, F. (2007). Ageing test results of low voltage MOSFET modules for electrical vehicles. In 2007 European Conference on Power Electronics and Applications, EPE [4417433] (2007 European Conference on Power Electronics and Applications, EPE). https://doi.org/10.1109/EPE.2007.4417433