TY - GEN
T1 - Ageing test results of low voltage MOSFET modules for electrical vehicles
AU - Dupont, Laurent
AU - Lefebvre, Stéphane
AU - Bouaroudj, Mounira
AU - Khatir, Zoubir
AU - Faugières, Jean Claude
AU - Emorine, Francis
PY - 2007/12/1
Y1 - 2007/12/1
N2 - HEV is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive / active thermal cycle ageing must be evaluated. Authors present first results on ageing and failure modes for a 75V/350A MOSFET module from a low voltage / cycled DC current test bench. Bond wires are used for electrical connections between dies and between dies and DCB substrates. For this kind of low voltage and high current module, the main lifetime limitation at high temperature is related to the electric connexions.
AB - HEV is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive / active thermal cycle ageing must be evaluated. Authors present first results on ageing and failure modes for a 75V/350A MOSFET module from a low voltage / cycled DC current test bench. Bond wires are used for electrical connections between dies and between dies and DCB substrates. For this kind of low voltage and high current module, the main lifetime limitation at high temperature is related to the electric connexions.
KW - Automotive application
KW - High temperature electronics
KW - Hybrid power integration
KW - MOSFET
KW - Packaging
KW - Power cycling
KW - Power semiconductor device
KW - Reliability
KW - Test bench
KW - Thermal stress
UR - http://www.scopus.com/inward/record.url?scp=51049110478&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=51049110478&partnerID=8YFLogxK
U2 - 10.1109/EPE.2007.4417433
DO - 10.1109/EPE.2007.4417433
M3 - Conference contribution
AN - SCOPUS:51049110478
SN - 9075815115
SN - 9789075815115
T3 - 2007 European Conference on Power Electronics and Applications, EPE
BT - 2007 European Conference on Power Electronics and Applications, EPE
T2 - 2007 European Conference on Power Electronics and Applications, EPE
Y2 - 2 September 2007 through 5 September 2007
ER -