Ageing test results of low voltage MOSFET modules for electrical vehicles

Abstract

HEV is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive / active thermal cycle ageing must be evaluated. Authors present first results on ageing and failure modes for a 75V/350A MOSFET module from a low voltage / cycled DC current test bench. Bond wires are used for electrical connections between dies and between dies and DCB substrates. For this kind of low voltage and high current module, the main lifetime limitation at high temperature is related to the electric connexions.

Original language	English
Title of host publication	2007 European Conference on Power Electronics and Applications, EPE
DOIs	https://doi.org/10.1109/EPE.2007.4417433
Publication status	Published - 1 Dec 2007
Externally published	Yes
Event	2007 European Conference on Power Electronics and Applications, EPE - Aalborg, Denmark Duration: 2 Sep 2007 → 5 Sep 2007

Publication series

Name	2007 European Conference on Power Electronics and Applications, EPE

Conference

Conference	2007 European Conference on Power Electronics and Applications, EPE
Country	Denmark
City	Aalborg
Period	2.9.07 → 5.9.07

Keywords

Automotive application
High temperature electronics
Hybrid power integration
MOSFET
Packaging
Power cycling
Power semiconductor device
Reliability
Test bench
Thermal stress

ASJC Scopus subject areas

Energy Engineering and Power Technology
Electrical and Electronic Engineering

Access to Document

10.1109/EPE.2007.4417433

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Cite this

Ageing test results of low voltage MOSFET modules for electrical vehicles. / Dupont, Laurent; Lefebvre, Stéphane; Bouaroudj, Mounira; Khatir, Zoubir; Faugières, Jean Claude; Emorine, Francis.

2007 European Conference on Power Electronics and Applications, EPE. 2007. 4417433 (2007 European Conference on Power Electronics and Applications, EPE).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Dupont, L, Lefebvre, S, Bouaroudj, M, Khatir, Z, Faugières, JC & Emorine, F 2007, Ageing test results of low voltage MOSFET modules for electrical vehicles. in 2007 European Conference on Power Electronics and Applications, EPE., 4417433, 2007 European Conference on Power Electronics and Applications, EPE, 2007 European Conference on Power Electronics and Applications, EPE, Aalborg, Denmark, 2.9.07. https://doi.org/10.1109/EPE.2007.4417433

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abstract = "HEV is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive / active thermal cycle ageing must be evaluated. Authors present first results on ageing and failure modes for a 75V/350A MOSFET module from a low voltage / cycled DC current test bench. Bond wires are used for electrical connections between dies and between dies and DCB substrates. For this kind of low voltage and high current module, the main lifetime limitation at high temperature is related to the electric connexions.",

keywords = "Automotive application, High temperature electronics, Hybrid power integration, MOSFET, Packaging, Power cycling, Power semiconductor device, Reliability, Test bench, Thermal stress",

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AU - Faugières, Jean Claude

AU - Emorine, Francis

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KW - High temperature electronics

KW - Hybrid power integration

KW - MOSFET

KW - Packaging

KW - Power cycling

KW - Power semiconductor device

KW - Reliability

KW - Test bench

KW - Thermal stress

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