Abstract
This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters.
| Original language | English |
|---|---|
| Title of host publication | Thermosense: Thermal Infrared Applications XXXVIII |
| Publisher | SPIE |
| Volume | 9861 |
| ISBN (Electronic) | 9781510601024 |
| DOIs | |
| Publication status | Published - 2016 |
| Event | Thermosense: Thermal Infrared Applications XXXVIII - Baltimore, United States Duration: 18 Apr 2016 → 21 Apr 2016 |
Conference
| Conference | Thermosense: Thermal Infrared Applications XXXVIII |
|---|---|
| Country | United States |
| City | Baltimore |
| Period | 18.4.16 → 21.4.16 |
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Keywords
- Active thermal testing
- Defect characterization
- Emissivity
- Heat Source
- Infrared thermography
- Normalization
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Electrical and Electronic Engineering
- Applied Mathematics
Cite this
Active thermal NDT : Problems and solutions. / Vavilov, V. P.
Thermosense: Thermal Infrared Applications XXXVIII. Vol. 9861 SPIE, 2016. 98610I.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Active thermal NDT
T2 - Problems and solutions
AU - Vavilov, V. P.
PY - 2016
Y1 - 2016
N2 - This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters.
AB - This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters.
KW - Active thermal testing
KW - Defect characterization
KW - Emissivity
KW - Heat Source
KW - Infrared thermography
KW - Normalization
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UR - http://www.scopus.com/inward/citedby.url?scp=84982252344&partnerID=8YFLogxK
U2 - 10.1117/12.2222980
DO - 10.1117/12.2222980
M3 - Conference contribution
AN - SCOPUS:84982252344
VL - 9861
BT - Thermosense: Thermal Infrared Applications XXXVIII
PB - SPIE
ER -