Active thermal NDT: Problems and solutions

V. P. Vavilov

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters.

Original languageEnglish
Title of host publicationThermosense: Thermal Infrared Applications XXXVIII
PublisherSPIE
Volume9861
ISBN (Electronic)9781510601024
DOIs
Publication statusPublished - 2016
EventThermosense: Thermal Infrared Applications XXXVIII - Baltimore, United States
Duration: 18 Apr 2016 → 21 Apr 2016

Conference

ConferenceThermosense: Thermal Infrared Applications XXXVIII
CountryUnited States
CityBaltimore
Period18.4.16 → 21.4.16

Keywords

  • Active thermal testing
  • Defect characterization
  • Emissivity
  • Heat Source
  • Infrared thermography
  • Normalization

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Applied Mathematics

Access to Document

Fingerprint Dive into the research topics of 'Active thermal NDT: Problems and solutions'. Together they form a unique fingerprint.

    • Activities

    • 1 Participation in conference

    Thermosense: Thermal Infrared Applications-XXXVIII

    Vladimir Platonovich Vavilov (Participant)

    18 Apr 2016 → 22 Apr 2016

    Activity: Participating in or organising an event types › Participation in conference

    Cite this

    Vavilov, V. P. (2016). Active thermal NDT: Problems and solutions. In Thermosense: Thermal Infrared Applications XXXVIII (Vol. 9861). [98610I] SPIE. https://doi.org/10.1117/12.2222980