Active thermal NDT: Problems and solutions

Abstract

This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters.

Original language	English
Title of host publication	Thermosense: Thermal Infrared Applications XXXVIII
Publisher	SPIE
Volume	9861
ISBN (Electronic)	9781510601024
DOIs	https://doi.org/10.1117/12.2222980
Publication status	Published - 2016
Event	Thermosense: Thermal Infrared Applications XXXVIII - Baltimore, United States Duration: 18 Apr 2016 → 21 Apr 2016

Conference

Conference	Thermosense: Thermal Infrared Applications XXXVIII
Country	United States
City	Baltimore
Period	18.4.16 → 21.4.16

Keywords

Active thermal testing
Defect characterization
Emissivity
Heat Source
Infrared thermography
Normalization

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Electrical and Electronic Engineering
Applied Mathematics

Access to Document

10.1117/12.2222980

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1 Participation in conference

Thermosense: Thermal Infrared Applications-XXXVIII
Vladimir Platonovich Vavilov (Participant)
18 Apr 2016 → 22 Apr 2016
Activity: Participating in or organising an event types › Participation in conference

Cite this

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title = "Active thermal NDT: Problems and solutions",

abstract = "This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters.",

keywords = "Active thermal testing, Defect characterization, Emissivity, Heat Source, Infrared thermography, Normalization",

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KW - Emissivity

KW - Heat Source

KW - Infrared thermography

KW - Normalization

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