Activities per year
Abstract
This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters.
Original language | English |
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Title of host publication | Thermosense: Thermal Infrared Applications XXXVIII |
Publisher | SPIE |
Volume | 9861 |
ISBN (Electronic) | 9781510601024 |
DOIs | |
Publication status | Published - 2016 |
Event | Thermosense: Thermal Infrared Applications XXXVIII - Baltimore, United States Duration: 18 Apr 2016 → 21 Apr 2016 |
Conference
Conference | Thermosense: Thermal Infrared Applications XXXVIII |
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Country | United States |
City | Baltimore |
Period | 18.4.16 → 21.4.16 |
Keywords
- Active thermal testing
- Defect characterization
- Emissivity
- Heat Source
- Infrared thermography
- Normalization
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Electrical and Electronic Engineering
- Applied Mathematics
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Activities
- 1 Participation in conference
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Thermosense: Thermal Infrared Applications-XXXVIII
Vladimir Platonovich Vavilov (Participant)
18 Apr 2016 → 22 Apr 2016Activity: Participating in or organising an event types › Participation in conference