Active thermal NDT

Problems and solutions

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters.

Original languageEnglish
Title of host publicationThermosense: Thermal Infrared Applications XXXVIII
PublisherSPIE
Volume9861
ISBN (Electronic)9781510601024
DOIs
Publication statusPublished - 2016
EventThermosense: Thermal Infrared Applications XXXVIII - Baltimore, United States
Duration: 18 Apr 201621 Apr 2016

Conference

ConferenceThermosense: Thermal Infrared Applications XXXVIII
CountryUnited States
CityBaltimore
Period18.4.1621.4.16

Fingerprint

Nondestructive examination
Infrared radiation
Thermal Infrared
Multiplicative Noise
Additive Noise
Heat Source
heat sources
Imager
Image sensors
Inversion
Infrared
estimating
Defects
retarding
inversions
Testing
optimization
Optimization
defects
Hot Temperature

Keywords

  • Active thermal testing
  • Defect characterization
  • Emissivity
  • Heat Source
  • Infrared thermography
  • Normalization

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this

Vavilov, V. P. (2016). Active thermal NDT: Problems and solutions. In Thermosense: Thermal Infrared Applications XXXVIII (Vol. 9861). [98610I] SPIE. https://doi.org/10.1117/12.2222980

Active thermal NDT : Problems and solutions. / Vavilov, V. P.

Thermosense: Thermal Infrared Applications XXXVIII. Vol. 9861 SPIE, 2016. 98610I.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Vavilov, VP 2016, Active thermal NDT: Problems and solutions. in Thermosense: Thermal Infrared Applications XXXVIII. vol. 9861, 98610I, SPIE, Thermosense: Thermal Infrared Applications XXXVIII, Baltimore, United States, 18.4.16. https://doi.org/10.1117/12.2222980
Vavilov VP. Active thermal NDT: Problems and solutions. In Thermosense: Thermal Infrared Applications XXXVIII. Vol. 9861. SPIE. 2016. 98610I https://doi.org/10.1117/12.2222980
Vavilov, V. P. / Active thermal NDT : Problems and solutions. Thermosense: Thermal Infrared Applications XXXVIII. Vol. 9861 SPIE, 2016.
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