Acoustic emission as method of chatter detection in cutting

N. N. Shamarin, A. V. Filippov, S. Yu Tarasov, O. A. Podgornyh, E. O. Filippova, A. V. Vorontsov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The possibility of using the acoustic emission method for monitoring the cutting process mode is considered. The influence of mechanical chatter in the technological system on the parameters of acoustic emission signals has been experimentally revealed. It is established that a short-term drop in the acoustic emission spectral power is observed in the transition from a steady to a chatter cutting regime. In the region of high-amplitude vibrations, the time dependencies of median frequency of the AE decreases, while that of the spectral power increases sharply.

Original languageEnglish
Title of host publicationProceedings of the Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures
EditorsVasily M. Fomin, Victor E. Panin, Sergey G. Psakhie
PublisherAmerican Institute of Physics Inc.
Volume2051
ISBN (Electronic)9780735417779
DOIs
Publication statusPublished - 12 Dec 2018
EventInternational Symposium on Hierarchical Materials: Development and Applications for New Technologies and Reliable Structures 2018 - Tomsk, Russian Federation
Duration: 1 Oct 20185 Oct 2018

Conference

ConferenceInternational Symposium on Hierarchical Materials: Development and Applications for New Technologies and Reliable Structures 2018
CountryRussian Federation
CityTomsk
Period1.10.185.10.18

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Shamarin, N. N., Filippov, A. V., Tarasov, S. Y., Podgornyh, O. A., Filippova, E. O., & Vorontsov, A. V. (2018). Acoustic emission as method of chatter detection in cutting. In V. M. Fomin, V. E. Panin, & S. G. Psakhie (Eds.), Proceedings of the Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures (Vol. 2051). [020276] American Institute of Physics Inc.. https://doi.org/10.1063/1.5083519