About methodical errors in studies of mass transfer processes induced by intense pulsed ion beams in solids

Research output: Contribution to conferencePaper

Abstract

The present paper briefly discusses the questions of accuracy of depth profiling techniques in studies of mass transfer processes induced by Intense Pulsed Ion Beam (IPIB) in solids. Best tools of measurements provide the good precision only. An acceptable reproducibility, correctness, and, finally, accuracy of measurements are a result of complete elimination all of the systematic errors. The first ones are caused by a dependence of main SIMS and AES analytical characteristics, ionization coefficients and sputtering factors, on a degree of IPIB exposure. It is shown that the preferable application of nuclear analysis methods, RBS and PIGE, avoids these errors. A mechanical polishing conventionally applied for surface preparation of specimen under investigation engenders to unpredictable changing of mechanical, electric and thermodynamic properties of surface layer, for at least 1 μm depth in case of Cu surface polishing and for the depth less than the previous one by the factor of 3-5 for α-Fe, steel, Zr, etc. An ignorance of this fact compels them to find a new ideas for an explanation of the unusual mass transfer. Surface preparation with electrochemical polishing allows to avoid a second kind of errors. Third kind of systematic errors are connected with vagueness of main IPIB parameters (ion species, energy distribution, flux) at the investigated section of the sample modified. More detailed specimens' analyzing by cross section can be suggested in order to avoid these errors.

Original languageEnglish
Pages1110-1115
Number of pages6
Publication statusPublished - 1 Dec 1997
EventProceedings of the 1997 11th International Pulsed Power Conference. Part 2 (of 2) - Baltimore, MD, USA
Duration: 29 Jun 19972 Jul 1997

Other

OtherProceedings of the 1997 11th International Pulsed Power Conference. Part 2 (of 2)
CityBaltimore, MD, USA
Period29.6.972.7.97

Fingerprint

Ion beams
Mass transfer
Systematic errors
Polishing
Electrolytic polishing
Depth profiling
Secondary ion mass spectrometry
Ionization
Sputtering
Electric properties
Thermodynamic properties
Fluxes
Mechanical properties
Steel
Ions

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Ryzhkov, V. A. (1997). About methodical errors in studies of mass transfer processes induced by intense pulsed ion beams in solids. 1110-1115. Paper presented at Proceedings of the 1997 11th International Pulsed Power Conference. Part 2 (of 2), Baltimore, MD, USA, .

About methodical errors in studies of mass transfer processes induced by intense pulsed ion beams in solids. / Ryzhkov, Vladislav A.

1997. 1110-1115 Paper presented at Proceedings of the 1997 11th International Pulsed Power Conference. Part 2 (of 2), Baltimore, MD, USA, .

Research output: Contribution to conferencePaper

Ryzhkov, VA 1997, 'About methodical errors in studies of mass transfer processes induced by intense pulsed ion beams in solids' Paper presented at Proceedings of the 1997 11th International Pulsed Power Conference. Part 2 (of 2), Baltimore, MD, USA, 29.6.97 - 2.7.97, pp. 1110-1115.
Ryzhkov VA. About methodical errors in studies of mass transfer processes induced by intense pulsed ion beams in solids. 1997. Paper presented at Proceedings of the 1997 11th International Pulsed Power Conference. Part 2 (of 2), Baltimore, MD, USA, .
Ryzhkov, Vladislav A. / About methodical errors in studies of mass transfer processes induced by intense pulsed ion beams in solids. Paper presented at Proceedings of the 1997 11th International Pulsed Power Conference. Part 2 (of 2), Baltimore, MD, USA, .6 p.
@conference{2586ec5b931848ab9a3b6fc058225f59,
title = "About methodical errors in studies of mass transfer processes induced by intense pulsed ion beams in solids",
abstract = "The present paper briefly discusses the questions of accuracy of depth profiling techniques in studies of mass transfer processes induced by Intense Pulsed Ion Beam (IPIB) in solids. Best tools of measurements provide the good precision only. An acceptable reproducibility, correctness, and, finally, accuracy of measurements are a result of complete elimination all of the systematic errors. The first ones are caused by a dependence of main SIMS and AES analytical characteristics, ionization coefficients and sputtering factors, on a degree of IPIB exposure. It is shown that the preferable application of nuclear analysis methods, RBS and PIGE, avoids these errors. A mechanical polishing conventionally applied for surface preparation of specimen under investigation engenders to unpredictable changing of mechanical, electric and thermodynamic properties of surface layer, for at least 1 μm depth in case of Cu surface polishing and for the depth less than the previous one by the factor of 3-5 for α-Fe, steel, Zr, etc. An ignorance of this fact compels them to find a new ideas for an explanation of the unusual mass transfer. Surface preparation with electrochemical polishing allows to avoid a second kind of errors. Third kind of systematic errors are connected with vagueness of main IPIB parameters (ion species, energy distribution, flux) at the investigated section of the sample modified. More detailed specimens' analyzing by cross section can be suggested in order to avoid these errors.",
author = "Ryzhkov, {Vladislav A.}",
year = "1997",
month = "12",
day = "1",
language = "English",
pages = "1110--1115",
note = "Proceedings of the 1997 11th International Pulsed Power Conference. Part 2 (of 2) ; Conference date: 29-06-1997 Through 02-07-1997",

}

TY - CONF

T1 - About methodical errors in studies of mass transfer processes induced by intense pulsed ion beams in solids

AU - Ryzhkov, Vladislav A.

PY - 1997/12/1

Y1 - 1997/12/1

N2 - The present paper briefly discusses the questions of accuracy of depth profiling techniques in studies of mass transfer processes induced by Intense Pulsed Ion Beam (IPIB) in solids. Best tools of measurements provide the good precision only. An acceptable reproducibility, correctness, and, finally, accuracy of measurements are a result of complete elimination all of the systematic errors. The first ones are caused by a dependence of main SIMS and AES analytical characteristics, ionization coefficients and sputtering factors, on a degree of IPIB exposure. It is shown that the preferable application of nuclear analysis methods, RBS and PIGE, avoids these errors. A mechanical polishing conventionally applied for surface preparation of specimen under investigation engenders to unpredictable changing of mechanical, electric and thermodynamic properties of surface layer, for at least 1 μm depth in case of Cu surface polishing and for the depth less than the previous one by the factor of 3-5 for α-Fe, steel, Zr, etc. An ignorance of this fact compels them to find a new ideas for an explanation of the unusual mass transfer. Surface preparation with electrochemical polishing allows to avoid a second kind of errors. Third kind of systematic errors are connected with vagueness of main IPIB parameters (ion species, energy distribution, flux) at the investigated section of the sample modified. More detailed specimens' analyzing by cross section can be suggested in order to avoid these errors.

AB - The present paper briefly discusses the questions of accuracy of depth profiling techniques in studies of mass transfer processes induced by Intense Pulsed Ion Beam (IPIB) in solids. Best tools of measurements provide the good precision only. An acceptable reproducibility, correctness, and, finally, accuracy of measurements are a result of complete elimination all of the systematic errors. The first ones are caused by a dependence of main SIMS and AES analytical characteristics, ionization coefficients and sputtering factors, on a degree of IPIB exposure. It is shown that the preferable application of nuclear analysis methods, RBS and PIGE, avoids these errors. A mechanical polishing conventionally applied for surface preparation of specimen under investigation engenders to unpredictable changing of mechanical, electric and thermodynamic properties of surface layer, for at least 1 μm depth in case of Cu surface polishing and for the depth less than the previous one by the factor of 3-5 for α-Fe, steel, Zr, etc. An ignorance of this fact compels them to find a new ideas for an explanation of the unusual mass transfer. Surface preparation with electrochemical polishing allows to avoid a second kind of errors. Third kind of systematic errors are connected with vagueness of main IPIB parameters (ion species, energy distribution, flux) at the investigated section of the sample modified. More detailed specimens' analyzing by cross section can be suggested in order to avoid these errors.

UR - http://www.scopus.com/inward/record.url?scp=0031348703&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031348703&partnerID=8YFLogxK

M3 - Paper

SP - 1110

EP - 1115

ER -