A study of radiation-enhanced oxygen diffusion into polycrystalline Li-Ti ferrite

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The diffusion of oxygen into polycrystalline lithium-titanium ferrite under heavy electron exposure was studied in this work. The effects of radiation were evaluated by comparing the diffusivities of oxygen in the irradiated samples with those in the samples that have been received under the heat treatments at the same temperatures and for the same time (873-1173 K and 240 min respectively). The diffusion of oxygen into the grain and in the region of grain boundaries in ferrites have been investigated by a new technique (1999) which is based on measuring of the electrical conductivity activation energy Ea of surface ferrite layers. For investigated ferrite the oxygen diffusion constant and the activation energy of the process were obtained. The thermal-radiation annealing results in increasing of values of the activation energy of diffusion and the pre-exponential factor Do.

Original languageEnglish
Title of host publicationProceedings - 2nd Annual Siberian Russian Student Workshop on Electron Devices and Materials, SREDM 2001
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages91-92
Number of pages2
ISBN (Print)5778203470, 9785778203471
DOIs
Publication statusPublished - 2001
Event2nd Annual Siberian Russian Student Workshop on Electron Devices and Materials, SREDM 2001 - Erlagol, Altai, Russian Federation
Duration: 3 Jul 20017 Jul 2001

Other

Other2nd Annual Siberian Russian Student Workshop on Electron Devices and Materials, SREDM 2001
CountryRussian Federation
CityErlagol, Altai
Period3.7.017.7.01

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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    Lysenko, E. N., & Ghyngazov, S. A. (2001). A study of radiation-enhanced oxygen diffusion into polycrystalline Li-Ti ferrite. In Proceedings - 2nd Annual Siberian Russian Student Workshop on Electron Devices and Materials, SREDM 2001 (pp. 91-92). [939162] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SREDM.2001.939162