A resonator microwave sensor for measuring the parameters of solar-quality silicon

A. V. Yurchenko, A. N. Novikov, Maria Valerievna Kitaeva

Research output: Contribution to journalArticle

Abstract

Nondestructive microwave and optical methods for contactless local measurements of resistivity, the lifetimes of minority charge carriers in single-crystal and polycrystalline semiconduc-tors, and lifetimes in photoelectric transducers are investigated.

Original languageEnglish
Pages (from-to)109-114
Number of pages6
JournalRussian Journal of Nondestructive Testing
Volume48
Issue number2
DOIs
Publication statusPublished - Feb 2012

Fingerprint

Microwave sensors
microwave sensors
Silicon
Charge carriers
Resonators
Transducers
resonators
Microwaves
Single crystals
life (durability)
silicon
minorities
charge carriers
transducers
optics
microwaves
electrical resistivity
single crystals

Keywords

  • Microwave sensor
  • Photoelectric transducer

ASJC Scopus subject areas

  • Mechanical Engineering
  • Mechanics of Materials
  • Condensed Matter Physics
  • Materials Science(all)

Cite this

A resonator microwave sensor for measuring the parameters of solar-quality silicon. / Yurchenko, A. V.; Novikov, A. N.; Kitaeva, Maria Valerievna.

In: Russian Journal of Nondestructive Testing, Vol. 48, No. 2, 02.2012, p. 109-114.

Research output: Contribution to journalArticle

Yurchenko, A. V. ; Novikov, A. N. ; Kitaeva, Maria Valerievna. / A resonator microwave sensor for measuring the parameters of solar-quality silicon. In: Russian Journal of Nondestructive Testing. 2012 ; Vol. 48, No. 2. pp. 109-114.
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