Abstract
Nondestructive microwave and optical methods for contactless local measurements of resistivity, the lifetimes of minority charge carriers in single-crystal and polycrystalline semiconduc-tors, and lifetimes in photoelectric transducers are investigated.
| Original language | English |
|---|---|
| Pages (from-to) | 109-114 |
| Number of pages | 6 |
| Journal | Russian Journal of Nondestructive Testing |
| Volume | 48 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Feb 2012 |
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Keywords
- Microwave sensor
- Photoelectric transducer
ASJC Scopus subject areas
- Mechanical Engineering
- Mechanics of Materials
- Condensed Matter Physics
- Materials Science(all)
Cite this
A resonator microwave sensor for measuring the parameters of solar-quality silicon. / Yurchenko, A. V.; Novikov, A. N.; Kitaeva, Maria Valerievna.
In: Russian Journal of Nondestructive Testing, Vol. 48, No. 2, 02.2012, p. 109-114.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - A resonator microwave sensor for measuring the parameters of solar-quality silicon
AU - Yurchenko, A. V.
AU - Novikov, A. N.
AU - Kitaeva, Maria Valerievna
PY - 2012/2
Y1 - 2012/2
N2 - Nondestructive microwave and optical methods for contactless local measurements of resistivity, the lifetimes of minority charge carriers in single-crystal and polycrystalline semiconduc-tors, and lifetimes in photoelectric transducers are investigated.
AB - Nondestructive microwave and optical methods for contactless local measurements of resistivity, the lifetimes of minority charge carriers in single-crystal and polycrystalline semiconduc-tors, and lifetimes in photoelectric transducers are investigated.
KW - Microwave sensor
KW - Photoelectric transducer
UR - http://www.scopus.com/inward/record.url?scp=84863652484&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84863652484&partnerID=8YFLogxK
U2 - 10.1134/S1061830912020118
DO - 10.1134/S1061830912020118
M3 - Article
VL - 48
SP - 109
EP - 114
JO - Russian Journal of Nondestructive Testing
JF - Russian Journal of Nondestructive Testing
SN - 1061-8309
IS - 2
ER -