A resonator microwave sensor for measuring the parameters of solar-quality silicon

A. V. Yurchenko, A. N. Novikov, Maria Valerievna Kitaeva

Research School of High-Energy Physics

Research output: Contribution to journal › Article › peer-review

Abstract

Nondestructive microwave and optical methods for contactless local measurements of resistivity, the lifetimes of minority charge carriers in single-crystal and polycrystalline semiconduc-tors, and lifetimes in photoelectric transducers are investigated.

Original language	English
Pages (from-to)	109-114
Number of pages	6
Journal	Russian Journal of Nondestructive Testing
Volume	48
Issue number	2
DOIs	https://doi.org/10.1134/S1061830912020118
Publication status	Published - Feb 2012

Keywords

Microwave sensor
Photoelectric transducer

ASJC Scopus subject areas

Mechanical Engineering
Mechanics of Materials
Condensed Matter Physics
Materials Science(all)

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10.1134/S1061830912020118

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abstract = "Nondestructive microwave and optical methods for contactless local measurements of resistivity, the lifetimes of minority charge carriers in single-crystal and polycrystalline semiconduc-tors, and lifetimes in photoelectric transducers are investigated.",

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author = "Yurchenko, {A. V.} and Novikov, {A. N.} and Maria Valerievna Kitaeva",

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AU - Novikov, A. N.

AU - Kitaeva, Maria Valerievna

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KW - Photoelectric transducer

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