A resonator microwave sensor for measuring the parameters of solar-quality silicon

A. V. Yurchenko, A. N. Novikov, Maria Valerievna Kitaeva

Research School of High-Energy Physics

Research output: Contribution to journal › Article

Abstract

Nondestructive microwave and optical methods for contactless local measurements of resistivity, the lifetimes of minority charge carriers in single-crystal and polycrystalline semiconduc-tors, and lifetimes in photoelectric transducers are investigated.

Original language	English
Pages (from-to)	109-114
Number of pages	6
Journal	Russian Journal of Nondestructive Testing
Volume	48
Issue number	2
DOIs	https://doi.org/10.1134/S1061830912020118
Publication status	Published - Feb 2012

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Keywords

Microwave sensor
Photoelectric transducer

ASJC Scopus subject areas

Mechanical Engineering
Mechanics of Materials
Condensed Matter Physics
Materials Science(all)

Cite this

Yurchenko, A. V., Novikov, A. N., & Kitaeva, MV. (2012). A resonator microwave sensor for measuring the parameters of solar-quality silicon. Russian Journal of Nondestructive Testing, 48(2), 109-114. https://doi.org/10.1134/S1061830912020118

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Access to Document

10.1134/S1061830912020118