Abstract
Nondestructive microwave and optical methods for contactless local measurements of resistivity, the lifetimes of minority charge carriers in single-crystal and polycrystalline semiconduc-tors, and lifetimes in photoelectric transducers are investigated.
Original language | English |
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Pages (from-to) | 109-114 |
Number of pages | 6 |
Journal | Russian Journal of Nondestructive Testing |
Volume | 48 |
Issue number | 2 |
DOIs | |
Publication status | Published - Feb 2012 |
Keywords
- Microwave sensor
- Photoelectric transducer
ASJC Scopus subject areas
- Mechanical Engineering
- Mechanics of Materials
- Condensed Matter Physics
- Materials Science(all)