Abstract
Nondestructive microwave and optical methods for contactless local measurements of resistivity, the lifetimes of minority charge carriers in single-crystal and polycrystalline semiconduc-tors, and lifetimes in photoelectric transducers are investigated.
| Original language | English |
|---|---|
| Pages (from-to) | 109-114 |
| Number of pages | 6 |
| Journal | Russian Journal of Nondestructive Testing |
| Volume | 48 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Feb 2012 |
Keywords
- Microwave sensor
- Photoelectric transducer
ASJC Scopus subject areas
- Mechanical Engineering
- Mechanics of Materials
- Condensed Matter Physics
- Materials Science(all)
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Yurchenko, A. V., Novikov, A. N., & Kitaeva, MV. (2012). A resonator microwave sensor for measuring the parameters of solar-quality silicon. Russian Journal of Nondestructive Testing, 48(2), 109-114. https://doi.org/10.1134/S1061830912020118