A resonator microwave sensor for measuring the parameters of solar-quality silicon

A. V. Yurchenko, A. N. Novikov, Maria Valerievna Kitaeva

Research output: Contribution to journalArticle

Abstract

Nondestructive microwave and optical methods for contactless local measurements of resistivity, the lifetimes of minority charge carriers in single-crystal and polycrystalline semiconduc-tors, and lifetimes in photoelectric transducers are investigated.

Original languageEnglish
Pages (from-to)109-114
Number of pages6
JournalRussian Journal of Nondestructive Testing
Volume48
Issue number2
DOIs
Publication statusPublished - Feb 2012

Keywords

  • Microwave sensor
  • Photoelectric transducer

ASJC Scopus subject areas

  • Mechanical Engineering
  • Mechanics of Materials
  • Condensed Matter Physics
  • Materials Science(all)

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