A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation

A. Aryshev, S. T. Boogert, D. Howell, P. Karataev, N. Terunuma, J. Urakawa

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in various facilities worldwide. The resolution of the monitor is defined by so-called Point Spread Function (PSF), source distribution generated by a single electron and projected by an optical system onto a screen. In this paper we represent the development of a novel sub-micrometre electron beam profile monitor based on the measurements of the PSF structure. The first experimental results are presented and future plans on the optimization of the monitor are discussed

Original languageEnglish
Article number012008
JournalJournal of Physics: Conference Series
Volume236
DOIs
Publication statusPublished - 2010
Externally publishedYes

Fingerprint

optical transition
monitors
micrometers
electron beams
point spread functions
charged particles
radiation
particle beams
profiles
dielectric properties
optimization
electrons

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation. / Aryshev, A.; Boogert, S. T.; Howell, D.; Karataev, P.; Terunuma, N.; Urakawa, J.

In: Journal of Physics: Conference Series, Vol. 236, 012008, 2010.

Research output: Contribution to journalArticle

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