A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

The proposed algorithm is based on the analysis of an artificial front-surface pixel-based function which includes temperature and time. This function experiences certain extremums, and the corresponding times can be used for determining thermal diffusivity by the formula similar to the known Parker expression. In thermal NDT, such approach being applied to defect areas, provides diffusivity variations which can be used for the evaluation of defect severity in a particular specimen. In this study, both the theoretical basis and the some experimental implementations of the proposed data processing algorithm have been explored to illustrate its validity in thermal properties measurement and thermal NDT, including thermal tomography.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9485
ISBN (Print)9781628416015
DOIs
Publication statusPublished - 2015
EventSPIE ThermoSense Conference: Thermal Infrared Applications XXXVII - Baltimore, United States
Duration: 20 Apr 201523 Apr 2015

Other

OtherSPIE ThermoSense Conference: Thermal Infrared Applications XXXVII
CountryUnited States
CityBaltimore
Period20.4.1523.4.15

Fingerprint

Infrared Thermography
Defect Detection
Thermal Properties
Thermodynamic properties
thermodynamic properties
Nondestructive examination
defects
thermal diffusivity
Defects
diffusivity
Thermal Diffusivity
tomography
Thermal diffusivity
pixels
Diffusivity
Tomography
evaluation
Pixel
Pixels
Evaluation

Keywords

  • Data processing
  • Diffusivity measurement
  • Modeling
  • Thermal nondestructive testing

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography. / Vavilov, V. P.; Shiryaev, V. V.; Chulkov, A. O.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9485 SPIE, 2015. 94850V.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Vavilov, VP, Shiryaev, VV & Chulkov, AO 2015, A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 9485, 94850V, SPIE, SPIE ThermoSense Conference: Thermal Infrared Applications XXXVII, Baltimore, United States, 20.4.15. https://doi.org/10.1117/12.2175645
@inproceedings{a78d0c8ea70b4cbdb6bae39f7a545ce9,
title = "A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography",
abstract = "The proposed algorithm is based on the analysis of an artificial front-surface pixel-based function which includes temperature and time. This function experiences certain extremums, and the corresponding times can be used for determining thermal diffusivity by the formula similar to the known Parker expression. In thermal NDT, such approach being applied to defect areas, provides diffusivity variations which can be used for the evaluation of defect severity in a particular specimen. In this study, both the theoretical basis and the some experimental implementations of the proposed data processing algorithm have been explored to illustrate its validity in thermal properties measurement and thermal NDT, including thermal tomography.",
keywords = "Data processing, Diffusivity measurement, Modeling, Thermal nondestructive testing",
author = "Vavilov, {V. P.} and Shiryaev, {V. V.} and Chulkov, {A. O.}",
year = "2015",
doi = "10.1117/12.2175645",
language = "English",
isbn = "9781628416015",
volume = "9485",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",

}

TY - GEN

T1 - A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography

AU - Vavilov, V. P.

AU - Shiryaev, V. V.

AU - Chulkov, A. O.

PY - 2015

Y1 - 2015

N2 - The proposed algorithm is based on the analysis of an artificial front-surface pixel-based function which includes temperature and time. This function experiences certain extremums, and the corresponding times can be used for determining thermal diffusivity by the formula similar to the known Parker expression. In thermal NDT, such approach being applied to defect areas, provides diffusivity variations which can be used for the evaluation of defect severity in a particular specimen. In this study, both the theoretical basis and the some experimental implementations of the proposed data processing algorithm have been explored to illustrate its validity in thermal properties measurement and thermal NDT, including thermal tomography.

AB - The proposed algorithm is based on the analysis of an artificial front-surface pixel-based function which includes temperature and time. This function experiences certain extremums, and the corresponding times can be used for determining thermal diffusivity by the formula similar to the known Parker expression. In thermal NDT, such approach being applied to defect areas, provides diffusivity variations which can be used for the evaluation of defect severity in a particular specimen. In this study, both the theoretical basis and the some experimental implementations of the proposed data processing algorithm have been explored to illustrate its validity in thermal properties measurement and thermal NDT, including thermal tomography.

KW - Data processing

KW - Diffusivity measurement

KW - Modeling

KW - Thermal nondestructive testing

UR - http://www.scopus.com/inward/record.url?scp=84946095557&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84946095557&partnerID=8YFLogxK

U2 - 10.1117/12.2175645

DO - 10.1117/12.2175645

M3 - Conference contribution

AN - SCOPUS:84946095557

SN - 9781628416015

VL - 9485

BT - Proceedings of SPIE - The International Society for Optical Engineering

PB - SPIE

ER -