A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules

T. A. Nguyen, D. Labrousse, P. Y. Joubert, S. Lefebvre, S. Bontemps

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The ageing of the metallization layer (aluminum reconstruction) which is due to power cycling on dies of power semiconductor modules results in the redistribution of the current lines in the metallization layer but also in the elementary cells of the power dies (MOSFET or IGBT) with a critical risk of failure when local current density or local temperature reach a critical value. The paper reports on the estimation of the local degradation of the aluminum sheet resistance due to power cycling which is evaluated by means of an eddy current sensor. First results of experimental data on power dies are presented for the first time.

Original languageEnglish
Title of host publicationProceedings - PCIM Europe 2012
Subtitle of host publicationInternational Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
Pages757-766
Number of pages10
Publication statusPublished - 1 Dec 2012
Externally publishedYes
EventInternational Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2012 - Nuremberg, Germany
Duration: 8 May 201210 May 2012

Publication series

NamePCIM Europe Conference Proceedings
ISSN (Electronic)2191-3358

Conference

ConferenceInternational Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2012
CountryGermany
CityNuremberg
Period8.5.1210.5.12

Fingerprint

Eddy currents
Semiconductor materials
Metallizing
Aluminum
Aluminum sheet
Sheet resistance
Insulated gate bipolar transistors (IGBT)
Current density
Aging of materials
Degradation
Sensors
Temperature

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Nguyen, T. A., Labrousse, D., Joubert, P. Y., Lefebvre, S., & Bontemps, S. (2012). A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules. In Proceedings - PCIM Europe 2012: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (pp. 757-766). (PCIM Europe Conference Proceedings).

A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules. / Nguyen, T. A.; Labrousse, D.; Joubert, P. Y.; Lefebvre, S.; Bontemps, S.

Proceedings - PCIM Europe 2012: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. 2012. p. 757-766 (PCIM Europe Conference Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nguyen, TA, Labrousse, D, Joubert, PY, Lefebvre, S & Bontemps, S 2012, A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules. in Proceedings - PCIM Europe 2012: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. PCIM Europe Conference Proceedings, pp. 757-766, International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2012, Nuremberg, Germany, 8.5.12.
Nguyen TA, Labrousse D, Joubert PY, Lefebvre S, Bontemps S. A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules. In Proceedings - PCIM Europe 2012: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. 2012. p. 757-766. (PCIM Europe Conference Proceedings).
Nguyen, T. A. ; Labrousse, D. ; Joubert, P. Y. ; Lefebvre, S. ; Bontemps, S. / A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules. Proceedings - PCIM Europe 2012: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. 2012. pp. 757-766 (PCIM Europe Conference Proceedings).
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