A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules

T. A. Nguyen, D. Labrousse, P. Y. Joubert, S. Lefebvre, S. Bontemps

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The ageing of the metallization layer (aluminum reconstruction) which is due to power cycling on dies of power semiconductor modules results in the redistribution of the current lines in the metallization layer but also in the elementary cells of the power dies (MOSFET or IGBT) with a critical risk of failure when local current density or local temperature reach a critical value. The paper reports on the estimation of the local degradation of the aluminum sheet resistance due to power cycling which is evaluated by means of an eddy current sensor. First results of experimental data on power dies are presented for the first time.

Original language	English
Title of host publication	Proceedings - PCIM Europe 2012
Subtitle of host publication	International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
Pages	757-766
Number of pages	10
Publication status	Published - 1 Dec 2012
Externally published	Yes
Event	International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2012 - Nuremberg, Germany Duration: 8 May 2012 → 10 May 2012

Publication series

Name	PCIM Europe Conference Proceedings
ISSN (Electronic)	2191-3358

Conference

Conference	International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2012
Country	Germany
City	Nuremberg
Period	8.5.12 → 10.5.12

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ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

Nguyen, T. A., Labrousse, D., Joubert, P. Y., Lefebvre, S., & Bontemps, S. (2012). A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules. In Proceedings - PCIM Europe 2012: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (pp. 757-766). (PCIM Europe Conference Proceedings).

A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules. / Nguyen, T. A.; Labrousse, D.; Joubert, P. Y.; Lefebvre, S.; Bontemps, S.

Proceedings - PCIM Europe 2012: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. 2012. p. 757-766 (PCIM Europe Conference Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Nguyen, TA, Labrousse, D, Joubert, PY, Lefebvre, S & Bontemps, S 2012, A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules. in Proceedings - PCIM Europe 2012: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. PCIM Europe Conference Proceedings, pp. 757-766, International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2012, Nuremberg, Germany, 8.5.12.

Nguyen TA, Labrousse D, Joubert PY, Lefebvre S, Bontemps S. A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules. In Proceedings - PCIM Europe 2012: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. 2012. p. 757-766. (PCIM Europe Conference Proceedings).

Nguyen, T. A. ; Labrousse, D. ; Joubert, P. Y. ; Lefebvre, S. ; Bontemps, S. / A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules. Proceedings - PCIM Europe 2012: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. 2012. pp. 757-766 (PCIM Europe Conference Proceedings).

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