@inproceedings{096370797d72413e925041421bbe0846,
title = "A measure using the eddy current technique on the effect of aluminum reconstruction in power semiconductor modules",
abstract = "The ageing of the metallization layer (aluminum reconstruction) which is due to power cycling on dies of power semiconductor modules results in the redistribution of the current lines in the metallization layer but also in the elementary cells of the power dies (MOSFET or IGBT) with a critical risk of failure when local current density or local temperature reach a critical value. The paper reports on the estimation of the local degradation of the aluminum sheet resistance due to power cycling which is evaluated by means of an eddy current sensor. First results of experimental data on power dies are presented for the first time.",
author = "Nguyen, {T. A.} and D. Labrousse and Joubert, {P. Y.} and S. Lefebvre and S. Bontemps",
year = "2012",
month = dec,
day = "1",
language = "English",
isbn = "9783800734313",
series = "PCIM Europe Conference Proceedings",
pages = "757--766",
booktitle = "Proceedings - PCIM Europe 2012",
note = "International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2012 ; Conference date: 08-05-2012 Through 10-05-2012",
}