A double-frame nanosecond soft X-ray backlighting system based on X-pinches

A. P. Artyomov, A. V. Fedyunin, S. A. Chaikovsky, A. S. Zhigalin, V. I. Oreshkin, N. A. Ratakhin, A. G. Rousskikh

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Abstract

The operation of a double-frame soft X-ray backlighting system on the basis of two table-top pulsed power generators and X-pinches is described. The system allows one to obtain two backlighting frames of a fast process with a nanosecond exposure (2-3 ns), a micrometer spatial resolution, and an adjustable delay between the frames. Backlighting registration of electrically exploding single aluminum wires was performed in the spectral range hν > 0.8 keV of the backlighting source using the double-frame system. The jitter time between X-ray pulses was within ±18 ns.

Original language	English
Pages (from-to)	66-71
Number of pages	6
Journal	Instruments and Experimental Techniques
Volume	56
Issue number	1
DOIs	https://doi.org/10.1134/S0020441213010028
Publication status	Published - 1 Jan 2013
Externally published	Yes

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ASJC Scopus subject areas

Instrumentation

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Artyomov, A. P., Fedyunin, A. V., Chaikovsky, S. A., Zhigalin, A. S., Oreshkin, V. I., Ratakhin, N. A., & Rousskikh, A. G. (2013). A double-frame nanosecond soft X-ray backlighting system based on X-pinches. Instruments and Experimental Techniques, 56(1), 66-71. https://doi.org/10.1134/S0020441213010028

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AU - Zhigalin, A. S.

AU - Oreshkin, V. I.

AU - Ratakhin, N. A.

AU - Rousskikh, A. G.

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10.1134/S0020441213010028