Abstract
The operation of a double-frame soft X-ray backlighting system on the basis of two table-top pulsed power generators and X-pinches is described. The system allows one to obtain two backlighting frames of a fast process with a nanosecond exposure (2-3 ns), a micrometer spatial resolution, and an adjustable delay between the frames. Backlighting registration of electrically exploding single aluminum wires was performed in the spectral range hν > 0.8 keV of the backlighting source using the double-frame system. The jitter time between X-ray pulses was within ±18 ns.
| Original language | English |
|---|---|
| Pages (from-to) | 66-71 |
| Number of pages | 6 |
| Journal | Instruments and Experimental Techniques |
| Volume | 56 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Jan 2013 |
| Externally published | Yes |
ASJC Scopus subject areas
- Instrumentation
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Artyomov, A. P., Fedyunin, A. V., Chaikovsky, S. A., Zhigalin, A. S., Oreshkin, V. I., Ratakhin, N. A., & Rousskikh, A. G. (2013). A double-frame nanosecond soft X-ray backlighting system based on X-pinches. Instruments and Experimental Techniques, 56(1), 66-71. https://doi.org/10.1134/S0020441213010028