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Research Output 1993 2019

Review article
4 Citations (Scopus)

Influence of repetitions of short-circuit conditions on IGBT lifetime

Saint-Eve, F., Lefebvre, S. & Khatir, Z., 1 Jan 2005, In : EPE Journal (European Power Electronics and Drives Journal). 15, 4, p. 7-12 6 p.

Research output: Contribution to journalReview article

Insulated gate bipolar transistors (IGBT)
Short circuit currents
Electron energy levels
Failure modes

Banc de cyclage actif pour l'analyse de la fatigue thermique des brasures de composants IGBTs

Translated title of the contribution: Active cycling bench for analysis of thermal fatigue in the soldering of Insulated Gate Bipolar Transistor (IGBT) componentsDupont, L., Lefebvre, S., Khatir, Z., Coquery, G. & Faugières, J. C., 1 Feb 2004, In : REE, Revue de L'Electricite et de L'Electronique. 2004, 2, p. 45-51 7 p.

Research output: Contribution to journalReview article

Thermal fatigue
Insulated gate bipolar transistors (IGBT)
Aging of materials