• 1285 Citations
  • 18 h-Index
1993 …2019

Research output per year

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Review article
2005

Influence of repetitions of short-circuit conditions on IGBT lifetime

Saint-Eve, F., Lefebvre, S. & Khatir, Z., 1 Jan 2005, In : EPE Journal (European Power Electronics and Drives Journal). 15, 4, p. 7-12 6 p.

Research output: Contribution to journalReview article

4 Citations (Scopus)
2004

Banc de cyclage actif pour l'analyse de la fatigue thermique des brasures de composants IGBTs

Translated title of the contribution: Active cycling bench for analysis of thermal fatigue in the soldering of Insulated Gate Bipolar Transistor (IGBT) componentsDupont, L., Lefebvre, S., Khatir, Z., Coquery, G. & Faugières, J. C., 1 Feb 2004, In : REE, Revue de L'Electricite et de L'Electronique. 2004, 2, p. 45-51 7 p.

Research output: Contribution to journalReview article