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Research Output 1993 2019

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Paper
2003
3 Citations (Scopus)

Reliability of CoolMOS™ under extremely hard repetitive electrical working conditions

Saint-Eve, F., Lefebvre, S. & Khatir, Z., 1 Sep 2003, p. 312-315. 4 p.

Research output: Contribution to conferencePaper

Insulated gate bipolar transistors (IGBT)
Short circuit currents
Transistors
Aging of materials
2000
8 Citations (Scopus)

Thermal analysis of high power IGBT modules

Khatir, Z. & Lefebvre, S., 1 Dec 2000, p. 271-274. 4 p.

Research output: Contribution to conferencePaper

Insulated gate bipolar transistors (IGBT)
Soldering alloys
Thermoanalysis
Cracks
Copper
1994
1 Citation (Scopus)

Turn-off analysis of the IGBT used in ZCS mode

Lefebvre, S., Forest, F., Calmon, F. & Chante, J. P., 1 Dec 1994, p. 99-104. 6 p.

Research output: Contribution to conferencePaper

Insulated gate bipolar transistors (IGBT)
Zero current switching