Fingerprint Dive into the research topics where Stephane Lefebvre is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Engineering & Materials Science
Insulated gate bipolar transistors (IGBT)
Short circuit currents
Aging of materials
Metallizing
Transistors
Failure modes
Junction gate field effect transistors
Power electronics
Temperature
Silicon carbide
Substrates
Thermal fatigue
Soldering alloys
Wire
Degradation
Semiconductor materials
Copper
Electric potential
Eddy currents
Aluminum
Diodes
Thermal cycling
Polychlorinated biphenyls
Silicon
Switching frequency
Metals
High temperature applications
Cracks
MOSFET devices
Networks (circuits)
Leakage currents
Hot Temperature
Thermal aging
Foams
Zero voltage switching
Threshold voltage
Fatigue of materials
Printed circuit boards
Semiconductor devices
Boundary element method
Bipolar transistors
Monitoring
Aviation
Thermoanalysis
Oxides
Inductance
Brittle fracture
Avionics
Defects
Power MOSFET
Chemical Compounds
Short circuit currents
Insulated gate bipolar transistors (IGBT)
Aging of materials
Metallizing
Junction gate field effect transistors
Failure modes
Wire
Power electronics
Transistors
Soldering alloys
Aluminum
Substrates
Temperature
Degradation
Thermal fatigue
Metals
Copper
Semiconductor materials
Printed circuit boards
MOSFET devices
Silicon
Threshold voltage
Eddy currents
Electric potential
Foams
Diodes
Insulator Elements
Physics & Astronomy
Engineering
short circuits
field effect transistors
failure modes
transistors
JFET
semiconductor devices
modules
life (durability)
eddy currents
bipolar transistors
General
solders
chips
degradation
thermal fatigue
electronics
cracks
Physics
cycles
threshold voltage
temperature
electric potential
Chemistry and Materials
silicon carbides
wire
copper
ceramics
Mathematical and Computer Sciences
boundary element method